FIS : Fabric Inspection System- An overview
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Date
2012-09-17T06:32:59Z
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Abstract
In developing countries like India mostly defects
arising on the fabrics are still detected manually
which consumes more time. To establish good
company image and to be more competitive in the
marketplace, inspection system can ensure the
optimum quality of product on hand and help to
improve the product quality. Therefore, a lot of
factories pay attention to improve the inspection
system, especially in textile industry. The automated
inspection by machine, on the other hand, can solve
this shortcoming. Secondly, it eliminates high
inspection error due to human frailty. Thirdly ,it can
save the labor cost, and reduce the demand for highly
skilled inspectors. Various approaches for fabric
defect detection have been proposed in past. In the
present paper the comprehensive list of references
to some recent works and techniques are discussed
and explains how image processing and ATMEL
Microcontroller helps to identify the defects on the
fabrics. The recognizer identifies any faults through
ATMEL microcontroller by the circuit operation. For
programming the controller Atmel program is used.
In addition to that a stepper motor is connected in the
output. This motor operates if there is no fault and
fails if the fault is identified. The recognizer is
suitable for developing countries identifies the fabric
defects within economical cost and produces less
error prone inspection system in real time.
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FIS : Fabric Inspection System- An overview, ASHWINI G.B, REKHA.C, VIPULA SHREE.D