Digital IC Tester with Embedded Truth Table
| dc.contributor.author | Arun, M | |
| dc.contributor.author | Sumanth Kumar, V.S | |
| dc.contributor.author | Monica S, Kumar | |
| dc.date.accessioned | 2016-08-08T07:57:01Z | |
| dc.date.available | 2016-08-08T07:57:01Z | |
| dc.date.issued | 2016-08-08T07:57:01Z | |
| dc.description.abstract | IC’s, the main component of each and every electronic circuit can be used for wide variety of purposes and functions. But sometime due to faulty ICs the circuit doesn’t work. Indeed it is lot tedious work to debug the circuit and confirm whether the circuiting is creating problem or the IC itself is dead. So to come up with these sorts of problems we intend to make a project which would confirm whether the IC under consideration is working properly or not. The Digital Integrated Circuit Tester implemented as in this paper is capable of testing 14-20 pin’s Integrated Circuits (ICs) of 74xx, 40xx, series. First, the system welcomes the user, then it will ask the user in which method the IC has to be tested, based on the user requirements it will check the IC in either auto search method method or manual search method. Auto-search method will just tell the user whether the IC is included in the ZIF socket and IC is good or bad. In manual search method .first the user has to enter the IC number then as per the requirements of the user system will display the truth table and result about the integrated circuit. Since we are making use of ARDUINO AT-MEGA we can extend the number of IC’s that has to tested and the same thing can be implemented as universal IC tester, compared to present IC tester our prototype cost’s less. | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/6384 | |
| dc.language.iso | en | en_US |
| dc.subject | Monica S Kumar | en_US |
| dc.subject | Digital IC Tester with Embedded Truth Table | en_US |
| dc.subject | M.Arun | en_US |
| dc.subject | Sumanth Kumar | en_US |
| dc.title | Digital IC Tester with Embedded Truth Table | en_US |
| dc.type | Thesis | en_US |